Inventor · disambiguated record

Tae Youn Lim

Also filed as: LIM TAE-YOUN

2 granted patents·0 citations·filing 2012–2019

23Inventor score

Technology areasG01R H10P

Files withLIM TAE-YOUN1 SAMSUNG ELECTRONICS CO LTD1

Top patents by PatentIndex Score

2 records

0143US11243247B2Device and method for testing semiconductor device and test handlerSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Feb 8, 2022·0 cites·20 claims
0220US9164127B2Contactor and semiconductor test apparatus comprising the sameLIM TAE-YOUN·Filed 2012·Granted Oct 20, 2015·0 cites·19 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →