Inventor · disambiguated record
Taek Cheon Kim
Also filed as: KIM TAEK CHEON
2 granted patents·9 citations·filing 2001–2004
54Inventor score
Top patents by PatentIndex Score
2 records- 0152US6972422B2Method for measuring particles in glass substrateSAMSUNG CORNING PREC GLASS CO·Filed 2004·Granted Dec 6, 2005·3 cites·5 claims
- 0245US6590221B2On-line measuring system for measuring substrate thickness and the method thereofSAMSUNG CORNING CO LTD·Filed 2001·Granted Jul 8, 2003·6 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →