Inventor · disambiguated record
Takahide Kamiyama
Also filed as: KAMIYAMA TAKAHIDE
0 granted patents·2 pending applications·0 citations·filing 2009–2009
Files withNIKON CORP2
Top patents by PatentIndex Score
2 records- 0150US2010171022A1Support structure and exposure apparatusNIKON CORP·Filed 2009·Application pending·0 cites
- 0249US2010165309A1Deformation measuring apparatus, exposure apparatus, jig for the deformation measuring apparatus, position measuring method and device fabricating methodNIKON CORP·Filed 2009·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →