Inventor · disambiguated record

Tatsuya Ishiwatari

Also filed as: ISHIWATARI TATSUYA

1 granted patent·1 citations·filing 2012–2012

16Inventor score

Technology areasG01R

Files withNIHON MICRONICS KK1

Top patents by PatentIndex Score

1 record

0153US9146256B2Probe assembly for inspecting power semiconductor devices and inspection apparatus using the same, the probe assembly having a probe block, a probe, and a cooling deviceNIHON MICRONICS KK·Filed 2012·Granted Sep 29, 2015·1 cites·9 claims

Join the waitlist — get patent alerts

Get an alert when Tatsuya Ishiwatari files or is granted a new patent.

We store only your email — no account needed. See our privacy policy.

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →