Inventor · disambiguated record
Steve W. Tuszynski
Also filed as: TUSZYNSKI STEVE W
12 granted patents·283 citations·filing 2002–2011
93Inventor score
Files withTUSZYNSKI STEVE W11
Top patents by PatentIndex Score
12 records- 0195US7660642B1Dynamic control system for manufacturing processesTUSZYNSKI STEVE W·Filed 2006·Granted Feb 9, 2010·32 cites·14 claims
- 0293US6687558B2Manufacturing design and process analysis systemFiled 2003·Granted Feb 3, 2004·74 cites·38 claims
- 0390US7840297B1Dynamic control system for manufacturing processes including indirect process variable profilesTUSZYNSKI STEVE W·Filed 2008·Granted Nov 23, 2010·26 cites·22 claims
- 0490US7187992B2Manufacturing design and process analysis systemTUSZYNSKI STEVE W·Filed 2004·Granted Mar 6, 2007·48 cites·76 claims
- 0586US7672745B1Manufacturing process analysis and optimization systemTUSZYNSKI STEVE W·Filed 2006·Granted Mar 2, 2010·19 cites·30 claims
- 0685US7239991B2Manufacturing design and process analysis and simulation systemTUSZYNSKI STEVE W·Filed 2004·Granted Jul 3, 2007·40 cites·37 claims
- 0784US8498727B1Dynamic control system for manufacturing processesTUSZYNSKI STEVE W·Filed 2011·Granted Jul 30, 2013·5 cites·18 claims
- 0884US7321848B2Manufacturing design and process analysis systemTUSZYNSKI STEVE W·Filed 2005·Granted Jan 22, 2008·9 cites·20 claims
- 0982US7072808B2Manufacturing design and process analysis systemTUSZYNSKI STEVE W·Filed 2002·Granted Jul 4, 2006·22 cites·92 claims
- 1077US7917234B2Manufacturing design and process analysis systemTUSZYNSKI STEVE W·Filed 2007·Granted Mar 29, 2011·5 cites·29 claims
- 1173US8768500B2Manufacturing design and process analysis systemTUSZYNSKI STEVE W·Filed 2011·Granted Jul 1, 2014·2 cites·10 claims
- 1265US8068928B1Dynamic control system for manufacturing processesTUSZYNSKI STEVE W·Filed 2010·Granted Nov 29, 2011·1 cites·10 claims
Join the waitlist — get patent alerts
Get an alert when Steve W. Tuszynski files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →