Inventor · disambiguated record
Shun-Ker Wu
Also filed as: WU SHUN-KER
5 granted patents·12 citations·filing 2004–2013
71Inventor score
Top patents by PatentIndex Score
5 records- 0167US9036434B1Random access memory and method of adjusting read timing thereofNANYA TECHNOLOGY CORP·Filed 2013·Granted May 19, 2015·4 cites·6 claims
- 0262US7459925B1Probe cardNANYA TECHNOLOGY CORP·Filed 2008·Granted Dec 2, 2008·5 cites·11 claims
- 0349US8058888B2Test apparatus for electronic device package and method for testing electronic device packageWU SHUN-KER·Filed 2009·Granted Nov 15, 2011·3 cites·20 claims
- 0438US7663391B2Test system and method for reducing test signal loss for integrated circuitsNANYA TECHNOLOGY CORP·Filed 2008·Granted Feb 16, 2010·0 cites·8 claims
- 0528US6940769B2Method of driving and testing a semiconductor memory deviceNANYA TECHNOLOGY CORP·Filed 2004·Granted Sep 6, 2005·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →