Inventor · disambiguated record
Shigenori Watari
Also filed as: WATARI SHIGENORI
13 granted patents·2 pending applications·180 citations·filing 2000–2014
92Inventor score
Top patents by PatentIndex Score
15 records- 0196US7964140B2Automatic analyzerHITACHI HIGH TECH CORP·Filed 2010·Granted Jun 21, 2011·29 cites·3 claims
- 0292US6737021B2Automatic analyzerHITACHI LTD·Filed 2001·Granted May 18, 2004·46 cites·6 claims
- 0387US9291634B2Chemical analysis apparatus and chemical analysis methodHITACHI HIGH TECH CORP·Filed 2014·Granted Mar 22, 2016·4 cites·5 claims
- 0485US6891182B2Apparatus for automatically detecting size to be detected and automatic analyzer using the sameOPTOELECTRONICS CO LTD·Filed 2002·Granted May 10, 2005·33 cites·14 claims
- 0583US7670558B2Chemical analysis apparatus and chemical analysis methodHITACHI HIGH TECH CORP·Filed 2006·Granted Mar 2, 2010·6 cites·10 claims
- 0678US6875401B1Automatic analyzerHITACHI LTD·Filed 2000·Granted Apr 5, 2005·25 cites·9 claims
- 0777US7785534B2Automatic analyzerHITACHI HIGH TECH CORP·Filed 2004·Granted Aug 31, 2010·17 cites·3 claims
- 0874US7521703B2Automatic analyzerHITACHI HIGH TECH CORP·Filed 2007·Granted Apr 21, 2009·4 cites·6 claims
- 0973US7722815B2Chemical analysis apparatus and chemical analysis methodHITACHI HIGH TECH CORP·Filed 2003·Granted May 25, 2010·8 cites·5 claims
- 1066US8658102B2Chemical analysis apparatus and chemical analysis methodKATOU HAJIME·Filed 2010·Granted Feb 25, 2014·1 cites·4 claims
- 1154US7955557B2Automatic analyzerHITACHI LTD·Filed 2003·Granted Jun 7, 2011·4 cites·8 claims
- 1250US6773672B2Automatic analysis apparatusHITACHI LTD·Filed 2001·Granted Aug 10, 2004·3 cites·8 claims
- 1349US2008063563A1Sample transport rackWATARI SHIGENORI·Filed 2007·Application pending·0 cites
- 1448US2008213132A1Automatic analyzerWATARI SHIGENORI·Filed 2008·Application pending·0 cites
- 1540US8765474B2Automatic analyzer and the analyzing method using the sameKAMBARA KATSUHIRO·Filed 2008·Granted Jul 1, 2014·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →