Inventor · disambiguated record
Shunichi Watabe
Also filed as: WATABE SHUNICHI
2 granted patents·1 pending application·0 citations·filing 2015–2022
23Inventor score
Technology areasH10P
Files withMITSUBISHI ELECTRIC CORP3
Top patents by PatentIndex Score
3 records- 0142US2022336293A1Inspection device, inspection method of semiconductor substrate, manufacturing method of semiconductor substrate, and manufacturing method of semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2022·Application pending·0 cites
- 0237US10811368B2Method for manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2019·Granted Oct 20, 2020·0 cites·6 claims
- 0325US9922944B2Method for manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2015·Granted Mar 20, 2018·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →