Inventor · disambiguated record
Shinya Iwasa
Also filed as: IWASA SHINYA
10 granted patents·179 citations·filing 1993–2014
90Inventor score
Top patents by PatentIndex Score
10 records- 0185US5361234ASemiconductor memory cell device having dummy capacitors reducing boundary level changes between a memory cell array area and a peripheral circuit areaNEC CORP·Filed 1993·Granted Nov 1, 1994·58 cites·5 claims
- 0282US5478768AMethod of manufacturing a semiconductor memory device having improved hold characteristic of a storage capacitorNEC CORP·Filed 1994·Granted Dec 26, 1995·50 cites·5 claims
- 0381US8759844B2Semiconductor device having elevated source and drainIWASA SHINYA·Filed 2011·Granted Jun 24, 2014·8 cites·20 claims
- 0476US8003472B2Method of manufacturing semiconductor deviceELPIDA MEMORY INC·Filed 2010·Granted Aug 23, 2011·5 cites·13 claims
- 0576US6313497B1Semiconductor device and method for manufacturing the sameNEC CORP·Filed 2000·Granted Nov 6, 2001·22 cites·15 claims
- 0672US9437265B2Semiconductor device having shallow trench isolation and gate grooveMICRON TECHNOLOGY INC·Filed 2014·Granted Sep 6, 2016·3 cites·22 claims
- 0765US6541335B2Semiconductor device and method for manufacturing the sameNEC CORP·Filed 2001·Granted Apr 1, 2003·12 cites·4 claims
- 0862US9236388B2Semi conductor device having elevated source and drainPS4 LUXCO SARL·Filed 2014·Granted Jan 12, 2016·1 cites·2 claims
- 0944US5955788ASemiconductor device having multilevel wiring with improved planarityNEC CORP·Filed 1997·Granted Sep 21, 1999·13 cites·14 claims
- 1030US6362024B1Semiconductor memory device manufacturing method with fuse cutting performance improvedNEC CORP·Filed 1999·Granted Mar 26, 2002·7 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →