Inventor · disambiguated record
Seymour Lenz
Also filed as: LENZ SEYMOUR · LENZ SEYMOUR S · LENZ SR SEYMOUR S
5 granted patents·221 citations·filing 1977–2003
84Inventor score
Technology areasG01R
Top patents by PatentIndex Score
5 records- 0193US4151465AVariable flexure test probe for microelectronic circuitsLENZ SEYMOUR S·Filed 1977·Granted Apr 24, 1979·101 cites·14 claims
- 0286US4618821ATest probe assembly for microelectronic circuitsLENZ SEYMOUR S·Filed 1983·Granted Oct 21, 1986·55 cites·14 claims
- 0376US4177425AMultiple contact electrical test probe assemblyLENZ SEYMOUR·Filed 1977·Granted Dec 4, 1979·30 cites·11 claims
- 0473US6489795B1High-frequency test probe assembly for microcircuits and associated methodsFiled 2001·Granted Dec 3, 2002·28 cites·11 claims
- 0552US6788080B1Test probe assembly for circuits, circuit element arrays, and associated methodsFiled 2003·Granted Sep 7, 2004·7 cites·24 claims
Join the waitlist — get patent alerts
Get an alert when Seymour Lenz files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →