Inventor · disambiguated record
Seok-Young Han
Also filed as: HAN SEOK-YOUNG
2 granted patents·10 citations·filing 2004–2004
55Inventor score
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
2 records- 0150US7057411B2Semiconductor integrated circuit including test pins and method for testing thereofSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jun 6, 2006·5 cites·4 claims
- 0244US7321998B2Semiconductor integrated circuit having a number of data output pins capable of selectively providing output signals and test method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jan 22, 2008·5 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →