Inventor · disambiguated record
Robert David Conklin
Also filed as: CONKLIN ROBERT DAVID
8 granted patents·143 citations·filing 1999–1999
88Inventor score
Files withUNISYS CORP8
Top patents by PatentIndex Score
8 records- 0169US6363510B1Electronic system for testing chips having a selectable number of pattern generators that concurrently broadcast different bit streams to selectable sets of chip driver circuitsUNISYS CORP·Filed 1999·Granted Mar 26, 2002·32 cites·11 claims
- 0266US6415409B1System for testing IC chips selectively with stored or internally generated bit streamsUNISYS CORP·Filed 1999·Granted Jul 2, 2002·29 cites·10 claims
- 0363US6571365B1Initial stage of a multi-stage algorithmic pattern generator for testing IC chipsUNISYS CORP·Filed 1999·Granted May 27, 2003·25 cites·8 claims
- 0453US6477676B1Intermediate stage of a multi-stage algorithmic pattern generator for testing IC chipsUNISYS CORP·Filed 1999·Granted Nov 5, 2002·15 cites·14 claims
- 0552US6415408B1Multi-stage algorithmic pattern generator for testing IC chipsUNISYS CORP·Filed 1999·Granted Jul 2, 2002·16 cites·12 claims
- 0646US6363504B1Electronic system for testing a set of multiple chips concurrently or sequentially in selectable subsets under program control to limit chip power dissipationUNISYS CORP·Filed 1999·Granted Mar 26, 2002·13 cites·11 claims
- 0744US6480981B1Output stage of a multi-stage algorithmic pattern generator for testing IC chipsUNISYS CORP·Filed 1999·Granted Nov 12, 2002·11 cites·15 claims
- 0829US6405150B1Program storage device containing instructions that are spaced apart by unused bits that end on word boundaries and which generate chip testing bit streams of any lengthUNISYS CORP·Filed 1999·Granted Jun 11, 2002·2 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →