Inventor · disambiguated record
Robert W. Beye
Also filed as: BEYE ROBERT W
1 granted patent·1 pending application·2 citations·filing 2014–2015
20Inventor score
Technology areasG01B
Files withWESTERN DIGITAL FREMONT LLC2
Top patents by PatentIndex Score
2 records- 0153US9194692B1Systems and methods for using white light interferometry to measure undercut of a bi-layer structureWESTERN DIGITAL FREMONT LLC·Filed 2014·Granted Nov 24, 2015·2 cites·12 claims
- 0235US2016061592A1Systems and methods for using white light interferometry to measure undercut of a bi-layer structureWESTERN DIGITAL FREMONT LLC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →