Inventor · disambiguated record
Richard Perego
Also filed as: PEREGO RICHARD
2 granted patents·14 citations·filing 2004–2009
58Inventor score
Top patents by PatentIndex Score
2 records- 0170US8278964B2Method and apparatus for test and characterization of semiconductor componentsWARE FREDERICK·Filed 2009·Granted Oct 2, 2012·5 cites·20 claims
- 0264US7592824B2Method and apparatus for test and characterization of semiconductor componentsRAMBUS INC·Filed 2004·Granted Sep 22, 2009·9 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →