Inventor · disambiguated record
Rakshit Kumar Singhal
Also filed as: SINGHAL RAKSHIT · SINGHAL RAKSHIT KUMAR
2 granted patents·1 pending application·10 citations·filing 2004–2008
54Inventor score
Top patents by PatentIndex Score
3 records- 0158US8510616B2Scalable scan-based test architecture with reduced test time and test powerSINGHAL RAKSHIT KUMAR·Filed 2008·Granted Aug 13, 2013·8 cites·18 claims
- 0246US7200690B2Memory access system providing increased throughput rates when accessing large volumes of data by determining worse case throughput rate delaysTEXAS INSTRUMENTS INC·Filed 2004·Granted Apr 3, 2007·2 cites·16 claims
- 0327US2010153759A1Power gating technique to reduce power in functional and test modesSINGHAL RAKSHIT·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →