Inventor · disambiguated record
Pierre Lebee
Also filed as: LEBEE PIERRE
2 granted patents·3 pending applications·65 citations·filing 1998–2006
66Inventor score
Technology areasG06F
Top patents by PatentIndex Score
5 records- 0171US6928378B2Stress testing at low cost through parallel execution of unit testsSUN MICROSYSTEMS INC·Filed 2003·Granted Aug 9, 2005·32 cites·30 claims
- 0251US6108744ASoftware interrupt mechanismSUN MICROSYSTEMS INC·Filed 1998·Granted Aug 22, 2000·33 cites·19 claims
- 0332US2009094429A1Generic Low Cost Hardware Mechanism for Memory ProtectionBOULE IVAN·Filed 2006·Application pending·0 cites
- 0432US2005010909A1Non-intrusive testing method for real-time softwareFiled 2003·Application pending·0 cites
- 0530US2007156997A1Memory allocationBOULE IVAN·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →