Inventor · disambiguated record
Peter Binkhoff
Also filed as: BINKHOFF PETER
2 granted patents·1 pending application·0 citations·filing 2000–2011
26Inventor score
Files withBINKHOFF PETER2
Top patents by PatentIndex Score
3 records- 0131US8943907B2Method and device for measuring a microelectromechanical semiconductor componentBINKHOFF PETER·Filed 2011·Granted Feb 3, 2015·0 cites·13 claims
- 0224US9322731B2Method for measuring a microelectromechanical semiconductor componentBINKHOFF PETER·Filed 2011·Granted Apr 26, 2016·0 cites·13 claims
- 0320US2001002594A1Method and device for removing deposits from the ends of contacting needles of semiconductor test devices and use of a substrate for this purposeFiled 2000·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →