Inventor · disambiguated record

Nathan Strader

Also filed as: STRADER NATHAN · STRADER NATHAN N

2 granted patents·24 citations·filing 2003–2003

60Inventor score

Technology areasH10P

Files withLSI LOGIC CORP2

Top patents by PatentIndex Score

2 records

0165US7013222B2Wafer edge inspection data gatheringLSI LOGIC CORP·Filed 2003·Granted Mar 14, 2006·15 cites·17 claims
0255US7079966B2Method of qualifying a process tool with wafer defect mapsLSI LOGIC CORP·Filed 2003·Granted Jul 18, 2006·9 cites·10 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →