Inventor · disambiguated record
Naoki Katanosaka
Also filed as: KATANOSAKA NAOKI
4 granted patents·45 citations·filing 1986–1997
75Inventor score
Technology areasG11C
Files withNEC CORP4
Top patents by PatentIndex Score
4 records- 0156US5751728ASemiconductor memory IC testing deviceNEC CORP·Filed 1997·Granted May 12, 1998·21 cites·4 claims
- 0244US4897817ASemiconductor memory device with a built-in test circuitNEC CORP·Filed 1988·Granted Jan 30, 1990·11 cites·5 claims
- 0340US4885721ASemiconductor memory device with redundant memory cellsNEC CORP·Filed 1988·Granted Dec 5, 1989·9 cites·10 claims
- 0430US4741003AShift register circuitNEC CORP·Filed 1986·Granted Apr 26, 1988·4 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →