Inventor · disambiguated record
Myoung-Rack Lee
Also filed as: LEE MYOUNG-RACK
2 granted patents·8 citations·filing 2004–2005
51Inventor score
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
2 records- 0160US7297950B2Transmission electron microscope specimen and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Nov 20, 2007·1 cites·19 claims
- 0256US7038218B2Inspection by a transmission electron microscope of a sampleSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted May 2, 2006·7 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →