Inventor · disambiguated record

Michael J. Wojtowecz

Also filed as: WOJTOWECZ MICHAEL · WOJTOWECZ MICHAEL J

1 granted patent·1 pending application·1 citations·filing 2020–2021

16Inventor score

Technology areasH10P

Files withGLOBALFOUNDRIES US INC2

Top patents by PatentIndex Score

2 records

0175US11728192B2Refining defect detection using process windowGLOBALFOUNDRIES US INC·Filed 2021·Granted Aug 15, 2023·1 cites·20 claims
0237US2022196580A1Defect inspection methods of semiconductor wafersGLOBALFOUNDRIES US INC·Filed 2020·Application pending·0 cites

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →