Inventor · disambiguated record
Meng-Kai Hsieh
Also filed as: HSIEH MENG-KAI
2 granted patents·1 pending application·0 citations·filing 2022–2025
26Inventor score
Files withNANYA TECHNOLOGY CORP3
Top patents by PatentIndex Score
3 records- 0174US2025334444A1Memory module and method for testing memory moduleNANYA TECHNOLOGY CORP·Filed 2025·Application pending·0 cites
- 0263US12372396B2Test system and methodNANYA TECHNOLOGY CORP·Filed 2022·Granted Jul 29, 2025·0 cites·20 claims
- 0352US12339732B2Fault analysis device and fault analysis method thereofNANYA TECHNOLOGY CORP·Filed 2022·Granted Jun 24, 2025·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →