Inventor · disambiguated record
Masatoshi Kawatake
Also filed as: KAWATAKE MASATOSHI
1 granted patent·2 pending applications·1 citations·filing 2018–2020
17Inventor score
Technology areasH10P
Files withRENESAS ELECTRONICS CORP3
Top patents by PatentIndex Score
3 records- 0156US10409260B2Abnormality detection system, semiconductor device manufacturing system and semiconductor device manufacturing methodRENESAS ELECTRONICS CORP·Filed 2018·Granted Sep 10, 2019·1 cites·18 claims
- 0239US2019346820A1Abnormality detection system, semiconductor device manufacturing system and semiconductor device manufacturing methodRENESAS ELECTRONICS CORP·Filed 2019·Application pending·0 cites
- 0328US2020410363A1Abnormality detection system and abnormality detection programRENESAS ELECTRONICS CORP·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →