Inventor · disambiguated record
Masao Asou
Also filed as: ASOU MASAO
1 granted patent·1 pending application·8 citations·filing 1999–2009
30Inventor score
Technology areasG01R
Top patents by PatentIndex Score
2 records- 0127US2010146349A1Semiconductor integrated circuit including logic circuit having scan path and test circuit for conducting scan path testNEC ELECTRONICS CORP·Filed 2009·Application pending·0 cites
- 0225US6415404B1Method of an apparatus for designing test facile semiconductor integrated circuitNEC CORP·Filed 1999·Granted Jul 2, 2002·8 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →