Inventor · disambiguated record
Matthew L. Adsitt
Also filed as: ADSITT MATTHEW L
2 granted patents·18 citations·filing 2006–2006
58Inventor score
Technology areasG11C
Files withMICRON TECHNOLOGY INC2
Top patents by PatentIndex Score
2 records- 0170US7454671B2Memory device testing system and method having real time redundancy repair analysisMICRON TECHNOLOGY INC·Filed 2006·Granted Nov 18, 2008·12 cites·46 claims
- 0257US7596729B2Memory device testing system and method using compressed fail dataMICRON TECHNOLOGY INC·Filed 2006·Granted Sep 29, 2009·6 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →