Inventor · disambiguated record
Lanyong Yin
Also filed as: YIN LANYONG
1 granted patent·2 pending applications·2 citations·filing 2019–2024
19Inventor score
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3 records- 0166US11199571B2Coaxial socket of impedance matching structure for semiconductor chip testing and manufacturing method thereofSUZHOU TAOSHENG ELECTRONIC TECH CO LTD·Filed 2019·Granted Dec 14, 2021·2 cites·3 claims
- 0246US2025020688A1Test socket for 224gbps ultra-high-speed coaxial testingSOLARIS NANOFAB LTD·Filed 2024·Application pending·0 cites
- 0322US2021088578A1Semiconductor test socket of hybrid coaxial structure and manufacturing method thereofSUZHOU TAOSHENG ELECTRONIC TECH CO LTD·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →