Inventor · disambiguated record
Kun-Jung Kuo
Also filed as: KUO KUN-JUNG
2 granted patents·0 citations·filing 2016–2018
28Inventor score
Files withAMBARELLA INC2
Top patents by PatentIndex Score
2 records- 0150US10393794B1Method for enhancing stability, robustness and throughput of semiconductor device test machines in low temperature conditionsAMBARELLA INC·Filed 2018·Granted Aug 27, 2019·0 cites·20 claims
- 0246US10126352B1Method for enhancing stability, robustness and throughput of semiconductor device test machines in low temperature conditionsAMBARELLA INC·Filed 2016·Granted Nov 13, 2018·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →