Inventor · disambiguated record
Kouji Kanba
Also filed as: KANBA KOUJI
1 granted patent·1 pending application·21 citations·filing 2002–2003
40Inventor score
Files withNEC ELECTRONICS CORP2
Top patents by PatentIndex Score
2 records- 0167US7024605B2Flip-flop and scan path circuitNEC ELECTRONICS CORP·Filed 2002·Granted Apr 4, 2006·21 cites·3 claims
- 0231US2005098779A1Production process for producing semiconductor devices, semiconductor devices produced thereby, and test system for carrying out yield-rate test in production of such semiconductor devicesNEC ELECTRONICS CORP·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →