Inventor · disambiguated record
Koichi Ebiya
Also filed as: EBIYA KOICHI
3 granted patents·74 citations·filing 1995–2002
73Inventor score
Technology areasG01R
Files withADVANTEST CORP3
Top patents by PatentIndex Score
3 records- 0187US6479983B1Semiconductor device testing apparatus having timing hold functionADVANTEST CORP·Filed 2000·Granted Nov 12, 2002·52 cites·9 claims
- 0269US6549000B2Semiconductor device testing apparatus having timing hold functionADVANTEST CORP·Filed 2002·Granted Apr 15, 2003·15 cites·10 claims
- 0333US5717352AWave formatter circuit for semiconductor test systemADVANTEST CORP·Filed 1995·Granted Feb 10, 1998·7 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →