Inventor · disambiguated record

Kazuhiro Takabe

Also filed as: TAKABE KAZUHIRO

1 granted patent·6 citations·filing 2008–2008

27Inventor score

Technology areasH10P

Files withTOKYO ELECTRON LTD1

Top patents by PatentIndex Score

1 record

0171US7719297B2Probe apparatus and method for measuring electrical characteristics of chips and storage medium thereforTOKYO ELECTRON LTD·Filed 2008·Granted May 18, 2010·6 cites·9 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →