Inventor · disambiguated record
Jong-Bok Tcho
Also filed as: TCHO JONG-BOK
3 granted patents·22 citations·filing 1998–2003
68Inventor score
Files withSAMSUNG ELECTRONICS CO LTD3
Top patents by PatentIndex Score
3 records- 0150US6842031B2Method of electrically testing semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jan 11, 2005·7 cites·15 claims
- 0248US7168017B2Memory devices with selectively enabled output circuits for test mode and method of testing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jan 23, 2007·6 cites·14 claims
- 0341US6201746B1Test method for high speed memory devices in which limit conditions for the clock are definedSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Mar 13, 2001·9 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →