Inventor · disambiguated record
Joseph P. Ramon
Also filed as: RAMON JOSEPH · RAMON JOSEPH P
2 granted patents·115 citations·filing 1999–2010
59Inventor score
Top patents by PatentIndex Score
2 records- 0186US6184048B1Testing method and apparatus assuring semiconductor device quality and reliabilityTEXAS INSTRUMENTS INC·Filed 1999·Granted Feb 6, 2001·115 cites·18 claims
- 0227US8134382B2Semiconductor wafer having scribe line test modules including matching portions from subcircuits on active dieCHATTERJEE TATHAGATA·Filed 2010·Granted Mar 13, 2012·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →