Inventor · disambiguated record
Hiroki Obi
Also filed as: OBI HIROKI
3 granted patents·1 pending application·30 citations·filing 2001–2013
69Inventor score
Top patents by PatentIndex Score
4 records- 0174US7382914B2Method for aligning two objects, method for detecting superimposing state of two objects, and apparatus for aligning two objectsTOKYO ELECTRON LTD·Filed 2005·Granted Jun 3, 2008·6 cites·8 claims
- 0274US6917698B2Method for aligning two objects, method for detecting superimposing state of two objects, and apparatus for aligning two objectsTOKYO ELECTRON LTD·Filed 2001·Granted Jul 12, 2005·21 cites·24 claims
- 0372US9568501B2Probe card attaching methodTOKYO ELECTRON LTD·Filed 2013·Granted Feb 14, 2017·3 cites·8 claims
- 0436US2012242359A1Probe card detecting apparatus, wafer position alignment apparatus and wafer position alignment methodOBI HIROKI·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →