Inventor · disambiguated record
Hideo Kobinata
Also filed as: KOBINATA HIDEO
5 granted patents·1 pending application·39 citations·filing 2000–2001
78Inventor score
Top patents by PatentIndex Score
6 records- 0173US6597001B1Method of electron-beam exposure and mask and electron-beam exposure system used thereinNEC ELECTRONICS CORP·Filed 2000·Granted Jul 22, 2003·17 cites·6 claims
- 0260US6492070B1Electron beam exposure mask and method for manufacturing electron beam exposure maskNEC CORP·Filed 2000·Granted Dec 10, 2002·9 cites·16 claims
- 0354US6462346B1Mask inspecting apparatus and mask inspecting method which can inspect mask by using electron beam exposure system without independently mounting another mask inspecting apparatusNEC CORP·Filed 2000·Granted Oct 8, 2002·6 cites·24 claims
- 0450US6638665B2Method and apparatus for designing EB maskNEC ELECTRONICS CORP·Filed 2001·Granted Oct 28, 2003·4 cites·12 claims
- 0547US6741733B1Drawing pattern verifying methodNEC ELECTRONICS CORP·Filed 2000·Granted May 25, 2004·3 cites·17 claims
- 0633US2001016292A1Electron beam mask, production method thereof, and exposure methodFiled 2000·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Hideo Kobinata files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →