Inventor · disambiguated record
Haruo Funakoshi
Also filed as: FUNAKOSHI HARUO
2 granted patents·11 citations·filing 1988–2001
56Inventor score
Files withMITSUBISHI ELECTRIC CORP2
Top patents by PatentIndex Score
2 records- 0150US6587801B2Abnormality-cause identifying apparatus and methodMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jul 1, 2003·6 cites·4 claims
- 0227US4954772ATest method of an electrostatic breakdown of a semiconductor device and an apparatus thereforMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Sep 4, 1990·5 cites·16 claims
Join the waitlist — get patent alerts
Get an alert when Haruo Funakoshi files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →