Inventor · disambiguated record
Giuseppe Amelio
Also filed as: AMELIO GIUSEPPE
3 granted patents·12 pending applications·0 citations·filing 2018–2025
41Inventor score
Top patents by PatentIndex Score
15 records- 0164US2024353481A1Probe-holder support and corresponding probes with facilitated mountingMICROTEST S P A·Filed 2024·Application pending·0 cites
- 0259US12504464B2Burn-in station for performing burn-in testing of electronic devicesMICROTEST S P A·Filed 2023·Granted Dec 23, 2025·0 cites·13 claims
- 0358US2025355022A1Method for manufacturing an interface element with elastic properties provided with internal electric vias, in particular for connecting a device to be tested to a testing head, and interface element obtained with said methodMICROTEST S P A·Filed 2025·Application pending·0 cites
- 0458US2025377380A1Method for manufacturing a metal structure for an elecronic circuit and corresponding metal structureMICROTEST S P A·Filed 2025·Application pending·0 cites
- 0557US2025377379A1Contact Probe with Customizable Geometry and Relative Probe HeadMICROTEST S P A·Filed 2025·Application pending·0 cites
- 0657US2025377403A1Burn-In Test Apparatus Arranged for High-Voltage and Low-Voltage TestsMICROTEST S P A·Filed 2025·Application pending·0 cites
- 0753US12099087B2Probe-holder support and corresponding probes with facilitated mountingMICROTEST S P A·Filed 2021·Granted Sep 24, 2024·0 cites·16 claims
- 0845US2025093405A1Shell for wafer level burn-in (wlbi) chip test, method for loading said shell and machine for burn-in test comprising said shellMICROTEST S P A·Filed 2024·Application pending·0 cites
- 0944US2024412934A1Switching deviceMICROTEST S P A·Filed 2024·Application pending·0 cites
- 1043US2024337683A1Method and System of Developing and Executing Test Program for Verifying DUTMICROTEST S P A·Filed 2024·Application pending·0 cites
- 1142US2024183882A1Probe head for wafer-level burn-in test (WLBI) and probe card comprising said probe headMICROSOFT S P A·Filed 2023·Application pending·0 cites
- 1241US2024183900A1Interface element with elastic properties provided with internal electric vias for connecting a device to be tested to a testing head, and method for manufacturing said interface elementMICROTEST S P A·Filed 2023·Application pending·0 cites
- 1341US2025123308A1Testing head with vertical probes for a probe card and corresponding method of assemblyMICROTEST S P A·Filed 2023·Application pending·0 cites
- 1439US2025069835A1A relay with magnetic field generation through a PCBMICROTEST S P A·Filed 2023·Application pending·0 cites
- 1525US11448665B2Heating device for carrying out temperature-dependent tests on electronic components arranged in a socketMICROTEST S R L·Filed 2018·Granted Sep 20, 2022·0 cites·17 claims
Join the waitlist — get patent alerts
Get an alert when Giuseppe Amelio files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →