Inventor · disambiguated record
Friedhelm Panteleit
Also filed as: PANTELEIT FRIEDHELM
2 granted patents·14 citations·filing 2007–2010
55Inventor score
Technology areasH01J
Top patents by PatentIndex Score
2 records- 0186US7645989B2Electron microscope for inspecting and processing of an object with miniaturized structures and method thereofZEISS CARL NTS GMBH·Filed 2007·Granted Jan 12, 2010·13 cites·19 claims
- 0254US8058614B2Electron microscope for inspecting and processing of an object with miniaturized structures and method thereofBIHR JOHANNES·Filed 2010·Granted Nov 15, 2011·1 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →