Inventor · disambiguated record

Edson D. Gomersall

Also filed as: GOMERSALL EDSON D

2 granted patents·72 citations·filing 1990–1991

66Inventor score

Technology areasG01R

Files withNAT SEMICONDUCTOR CORP2

Top patents by PatentIndex Score

2 records

0177US5095267AMethod of screening A.C. performance characteristics during D.C. parametric test operationNAT SEMICONDUCTOR CORP·Filed 1991·Granted Mar 10, 1992·51 cites·4 claims
0255US5039602AMethod of screening A.C. performance characteristics during D.C. parametric test operationNAT SEMICONDUCTOR CORP·Filed 1990·Granted Aug 13, 1991·21 cites·17 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →