Inventor · disambiguated record
Donald A. Chernoff
Also filed as: CHERNOFF DONALD A
2 granted patents·318 citations·filing 1996–1997
72Inventor score
Technology areasY10S
Top patents by PatentIndex Score
2 records- 0186US5825670AHigh precison calibration and feature measurement system for a scanning probe microscopeADVANCED SURFACE MICROSCOPY·Filed 1997·Granted Oct 20, 1998·185 cites·69 claims
- 0282US5644512AHigh precision calibration and feature measurement system for a scanning probe microscopeADVANCED SURFACE MICROSCOPY IN·Filed 1996·Granted Jul 1, 1997·133 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →