Inventor · disambiguated record
Dewey Killingsworth
Also filed as: KILLINGSWORTH DEWEY
2 granted patents·2 citations·filing 2014–2014
35Inventor score
Files withFREESCALE SEMICONDUCTOR INC2
Top patents by PatentIndex Score
2 records- 0158US9997423B2Semiconductor wafer and method of concurrently testing circuits formed thereonFREESCALE SEMICONDUCTOR INC·Filed 2014·Granted Jun 12, 2018·2 cites·20 claims
- 0236US9716031B2Semiconductor wafer and method of concurrently testing circuits formed thereonFREESCALE SEMICONDUCTOR INC·Filed 2014·Granted Jul 25, 2017·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →