Inventor · disambiguated record
Dean J. Grannes
Also filed as: GRANNES DEAN J
3 granted patents·28 citations·filing 2000–2002
69Inventor score
Files withINTEL CORP3
Top patents by PatentIndex Score
3 records- 0166US6596980B2Method and apparatus to measure statistical variation of electrical signal phase in integrated circuits using time-correlated photon countingINTEL CORP·Filed 2001·Granted Jul 22, 2003·13 cites·25 claims
- 0258US7018095B2Circuit for sensing on-die temperature at multiple locationsINTEL CORP·Filed 2002·Granted Mar 28, 2006·11 cites·11 claims
- 0344US6519744B2Semiconductor die manufacture method to limit a voltage drop on a power plane thereof by noninvasively measuring voltages on a power planeINTEL CORP·Filed 2000·Granted Feb 11, 2003·4 cites·21 claims
Join the waitlist — get patent alerts
Get an alert when Dean J. Grannes files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →