Inventor · disambiguated record
Dal-An Kwon
Also filed as: KWON DAL-AN
3 granted patents·1 pending application·1 citations·filing 2011–2015
47Inventor score
Top patents by PatentIndex Score
4 records- 0149US9250071B2Measurement apparatus and correction method of the sameLEE HYUN-KI·Filed 2011·Granted Feb 2, 2016·1 cites·17 claims
- 0233US2013194569A1Substrate inspection methodLEE HYUN-KI·Filed 2011·Application pending·0 cites
- 0331US10533952B2Method of inspecting a terminal of a component mounted on a substrate and substrate inspection apparatusKOH YOUNG TECH INC·Filed 2015·Granted Jan 14, 2020·0 cites·14 claims
- 0426US8855403B2Method of discriminating between an object region and a ground region and method of measuring three dimensional shape by using the sameKWON DAL-AN·Filed 2011·Granted Oct 7, 2014·0 cites·7 claims
Join the waitlist — get patent alerts
Get an alert when Dal-An Kwon files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →