Inventor · disambiguated record
Darren Bertanzetti
Also filed as: BERTANZETTI DARREN
6 granted patents·80 citations·filing 2007–2013
83Inventor score
Technology areasG01R
Top patents by PatentIndex Score
6 records- 0192US7739568B1Scan testing system for circuits under testMARVELL INT LTD·Filed 2007·Granted Jun 15, 2010·32 cites·46 claims
- 0289US8214704B1Scan testing system and methodBERTANZETTI DARREN·Filed 2011·Granted Jul 3, 2012·13 cites·22 claims
- 0388US8024631B1Scan testing system and methodMARVELL INT LTD·Filed 2007·Granted Sep 20, 2011·18 cites·41 claims
- 0487US7895488B1Control of clock gate cells during scan testingMARVELL INT LTD·Filed 2007·Granted Feb 22, 2011·15 cites·10 claims
- 0573US8689067B1Control of clock gate cells during scan testingMARVELL INT LTD·Filed 2013·Granted Apr 1, 2014·2 cites·20 claims
- 0646US8443246B1Control of clock gate cells during scan testingBERTANZETTI DARREN·Filed 2011·Granted May 14, 2013·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →