Inventor · disambiguated record
Cornelis Oene Cirkel
Also filed as: CIRKEL CORNELIS OENE
4 granted patents·30 citations·filing 2001–2003
73Inventor score
Top patents by PatentIndex Score
4 records- 0165US7218093B2Reduced chip testing scheme at wafer levelNXP BV·Filed 2003·Granted May 15, 2007·17 cites·7 claims
- 0245US7382141B2Testing a batch of electrical componentsNXP BV·Filed 2002·Granted Jun 3, 2008·6 cites·16 claims
- 0344US7035749B2Test machine for testing an integrated circuit with a comparatorKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Apr 25, 2006·2 cites·20 claims
- 0441US6833722B2Electronic circuit device with a short circuit switch using transistors and method of testing such a deviceKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted Dec 21, 2004·5 cites·2 claims
Join the waitlist — get patent alerts
Get an alert when Cornelis Oene Cirkel files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →