Inventor · disambiguated record
Chengchang Wei
Also filed as: Wei Chengchang
1 granted patent·1 pending application·0 citations·filing 2021–2022
4Inventor score
Files withSHANGHAI HUALI INTEGRATED CIRCUIT CORP2
Top patents by PatentIndex Score
2 records- 0137US12276920B2Method for avoiding damage to overlay metrology markSHANGHAI HUALI INTEGRATED CIRCUIT CORP·Filed 2022·Granted Apr 15, 2025·0 cites·8 claims
- 0231US2022231141A1High dielectric constant metal gate mos transistorSHANGHAI HUALI INTEGRATED CIRCUIT CORP·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →