Inventor · disambiguated record
Chie Iwasa
Also filed as: IWASA CHIE
2 granted patents·6 citations·filing 2000–2005
50Inventor score
Files withTOSHIBA KK2
Top patents by PatentIndex Score
2 records- 0151US7464296B2System and method for identifying failure candidates in a semiconductor apparatusTOSHIBA KK·Filed 2005·Granted Dec 9, 2008·2 cites·11 claims
- 0234US6810344B1Semiconductor testing method and semiconductor testing apparatus for semiconductor devices, and program for executing semiconductor testing methodTOSHIBA KK·Filed 2000·Granted Oct 26, 2004·4 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →