Inventor · disambiguated record
Byung-Hun Do
Also filed as: DO BYUNG-HUN
2 granted patents·7 citations·filing 2006–2007
51Inventor score
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
2 records- 0169US7626691B2Apparatus and method for inspecting overlay patterns in semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Dec 1, 2009·5 cites·13 claims
- 0251US7602492B2Overlay measuring method and related semiconductor fabrication equipment management systemSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Oct 13, 2009·2 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →