Inventor · disambiguated record
Bengt H. Tornblom
Also filed as: TOERNBLOM BENGT · TOERNBLOM BENGT H · TORNBLOM BENGT · TORNBLOM BENGT HJ
20 granted patents·197 citations·filing 1974–1990
95Inventor score
Files withTORNBLOMS KVALITETSKONTROLL AB9ASEA AB4TOERNBLOMS KVALITETSKONTROLL3TOERNBLOM BENGT H2TORNBLOMS KVALITESKONTROLL AB1
Top patents by PatentIndex Score
20 records- 0169US4853634ADevice for crack detection on hot cast billets and suppressing the effects of magnetic regionsTOERNBLOMS KVALITETSKONTROLL·Filed 1987·Granted Aug 1, 1989·29 cites·25 claims
- 0258US4761610AApparatus for determining the position of surface defects of a test objects with respect to an edge thereofASEA AB·Filed 1986·Granted Aug 2, 1988·19 cites·9 claims
- 0357US3944911AApparatus for magnetically detecting faults in metal bodies utilizing a multiphase generator to generate a rotating field in the bodyASEA AB·Filed 1974·Granted Mar 16, 1976·13 cites·1 claims
- 0455US4646013AMethod and apparatus for eddy current testing by at least two different frequency signalsTOERNBLOM BENGT H·Filed 1984·Granted Feb 24, 1987·15 cites·5 claims
- 0554US5111412AComposite sensing transducerTORNBLOMS KVALITETSKONTROLL AB·Filed 1989·Granted May 5, 1992·16 cites·20 claims
- 0653US4965519ASuppression of the effect of harmless surface defects in eddy current testing by sensitivity characteristic compensationTORNBLOMS KVALITETSKONTHOL AB·Filed 1989·Granted Oct 23, 1990·15 cites·4 claims
- 0753US3971982APlural frequency multi-phase transducer arrangement for detecting the presence and location of faults in a metal body and compensating for body movementsASEA AB·Filed 1975·Granted Jul 27, 1976·12 cites·1 claims
- 0849US4661777APlural frequency eddy current method and apparatus with lift-off compensation for detecting faults in electrically conductive objectsTORNBLOMS KVALITETSKONTROLL AB·Filed 1985·Granted Apr 28, 1987·13 cites·11 claims
- 0947US4837510ADevice for suppression and/or separation of signals due to magnetic oxide scales in hot cast billetsTORNBLOMS KVALITETSKONTROLL AB·Filed 1988·Granted Jun 6, 1989·11 cites·13 claims
- 1047US4237419AMethod and apparatus for non-destructive testing using a plurality of frequenciesTORNBLOMS KVALITETSKONTROLL AB·Filed 1978·Granted Dec 2, 1980·11 cites·24 claims
- 1143US4767986AOscillating transducers for monitoring the surface of elongated objectsTOERNBLOM BENGT H·Filed 1986·Granted Aug 30, 1988·5 cites·16 claims
- 1242US4851774ASuppression of the effect of harmless surface defects in eddy current testing by sensitivity characteristic compensationTORNBLOMS KVALITETSKONTROLL AB·Filed 1987·Granted Jul 25, 1989·7 cites·2 claims
- 1337US4789828ACoolant structure for a device for determining the quality of hot test objectsTORNBLOMS KVALITETSKONTROLL AB·Filed 1987·Granted Dec 6, 1988·6 cites·7 claims
- 1434US4734642ADevice for use in eddy current testing for transmission of signals between a signal processing device and a signal sourceTORNBLOMS KVALITETSKONTROLL AB·Filed 1986·Granted Mar 29, 1988·5 cites·10 claims
- 1533US4819181APerformance increasing signal processing deviceTORNBLOMS KVALITETSKONTROLL AB·Filed 1987·Granted Apr 4, 1989·4 cites·7 claims
- 1632US4703265AMethod and apparatus for compensating for different depths of sun currents induced in the object tested for imperfectionsTOERNBLOMS KVALITETSKONTROLL·Filed 1985·Granted Oct 27, 1987·4 cites·15 claims
- 1730US4945307AElectronic device for detecting irregularities in a surface of a solid objectTOERNBLOMS KVALITETSKONTROLL·Filed 1986·Granted Jul 31, 1990·3 cites·12 claims
- 1829US5117185ATransformer-coupled transducerTORNBLOMS KVALITETSKONTROLL AB·Filed 1990·Granted May 26, 1992·1 cites·9 claims
- 1929US4864235APhase-selective monitoring via vector transformationTORNBLOMS KVALITESKONTROLL AB·Filed 1988·Granted Sep 5, 1989·5 cites·7 claims
- 2027US4816760AMethod and apparatus for detecting the position of an edge of a test pieceASEA AB·Filed 1986·Granted Mar 28, 1989·3 cites·10 claims
Join the waitlist — get patent alerts
Get an alert when Bengt H. Tornblom files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →