Inventor · disambiguated record
Bae-Sun Jun
Also filed as: JUN BAE-SUN
2 granted patents·7 citations·filing 2004–2008
50Inventor score
Technology areasG11C
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
2 records- 0142US7240257B2Memory test circuit and test systemSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jul 3, 2007·6 cites·26 claims
- 0236US7760566B2Semiconductor memory device for preventing supply of excess specific stress item and test method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Jul 20, 2010·1 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →