Inventor · disambiguated record
Amit Wangoo
Also filed as: WANGOO AMIT
1 granted patent·1 pending application·0 citations·filing 2022–2025
13Inventor score
Technology areasG06F
Top patents by PatentIndex Score
2 records- 0159US2025283940A1Method, system and device of serializing and de-serializing the delivery of scan test data through chip i/o to reduce the scan test duration of an integrated circuitMARVELL ASIA PTE LTD·Filed 2025·Application pending·0 cites
- 0243US12313682B2Method, system and device of serializing and de-serializing the delivery of scan test data through chip I/O to reduce the scan test duration of an integrated circuitBISWAS SOUNIL·Filed 2022·Granted May 27, 2025·0 cites·30 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →